Because polyimide films like Kapton are used
extensively in space applications such as low Earth orbit (LEO), their
performance properties in space conditions are well characterized. Polyimide
foams, on the other hand, have not been particularly studied and characterized
in this environment. Recent advancements in high-temperature polymeric
materials at NASA Langley Research Center have led to the development of
new polyimide foam systems with attractive properties. These new polyimide
foam systems have potential space applications because of their light weight,
their relatively high operating temperature, and their cryogenic properties.
Before utilizing polyimide foams in the aggressive environment of
LEO, it is important to understand and predict performance characteristics
and
the mechanisms of degradation. This information is also important to
the protective measures that might be required in the utilization
of these
materials.
The atmosphere at LEO altitudes has a composition that is essentially
the reverse of that in the troposphere, 20-percent nitrogen and 80-percent
oxygen. Without the overlying atmosphere to filter short-wavelength
ultraviolet
(UV) radiation (less than 243 nanometers), the molecular oxygen present
is largely photo-dissociated to atomic oxygen (AO). Atomic oxygen
is highly reactive and thus is prone to rapidly oxidize materials
exposed
to it.
Making the situation more extreme is the fact that structures in
LEO are typically moving rapidly, as fast as 8 kilometers per
second, to
maintain
the orbit. Moving at that speed, it is typical for structures to
collide with atomic oxygen with energy of as much as 5 electronvolts
and to
encounter 1015 oxygen atoms per square centimeter of surface area
per second. In
this study, an oxygen plasma generator was utilized to produce an
atmosphere of atomic oxygen that would simulate the atmosphere
of LEO. The oxygen
plasma was generated with an SP1 Plasma Prep II plasma etcher. The
effective atomic oxygen flux was determined using ASTM E2089-00,
Standard Practices
for Ground Laboratory Atomic Oxygen Interaction Evaluation of Materials
for Space Applications.
Comparative surface analyses of samples seen in figure 1 (the first
letter after TEEK indicates the series and the second letter indicates
the density)
were performed with a Kratos XSAM X-ray photoelectron spectrometer
(XPS). XPS is a surface analysis technique that looks at the upper
atomic layers
of a solid surface. In XPS, electrons are ejected from a sample
surface with a particular binding energy characteristic of the
elements present.
Shifts in binding energy can be related to oxidation or chemical
states.
The mass loss data indicate that chemical structure, then density
effects, followed by surface area appear to have the greatest
influence on atomic
oxygen resistance for the HH, HL, LL, and CL series, with resistance
in decreasing order CL>LL>HH>HL (figure 2). The XPS data indicate
an overall oxidation of the foams. The data presented on the HL, LL,
and CL foams showing an increase in carbonyl after atomic oxygen exposure
correlate
with the data previously reported on polyimide films. The higher-density
HH series showed a decrease in the carbonyl group. This seems to indicate
that the plasma is reacting with this group preferentially over atoms
in the ring structure, resulting in some volatile products.
Key accomplishments:
- First surface chemistry
study to evaluate the new polyimide foams systems performance characteristics
with atomic oxygen for space
applications.
- A technical paper
was accepted for presentation and publication at the National American
Institute of Aeronautics and Astronautics
(AIAA) Meeting 2002.
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Key milestones:
- A related study
on the surface characterization of the weathering degradation of
polyimide foams is currently in progress, and a technical paper was
accepted for presentation at the 2002 National Meeting of the American
Chemical Society.
- Several more
publications and presentations on related research were made in 2001.

Figure 1. Chemical Structures of Foams
Figure 2. Mass Loss of TEEK HL, HH, LL, CL, and Kapton Tape
Contacts:
O. Melendez (Orlando.Melendez-1@ksc.nasa.gov),
YA-F2-C, (321) 867-9407; and M.K. Williams, YA-C2, (321) 867-4554
Participating Organizations: Langley Research Center (E.S. Weiser), University
of Central Florida (Dr. M.D. Hampton), Florida Institute of Technology (G.L.
Nelson), and North Carolina Agricultural and Technical State University (S. Brown,
KSC co-op
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